APA (7th ed.) Citation

Hayashi , M., Marcon, R., Nunes, D. R., Hayashi , M., Marcon, R., & Nunes, D. R. (2020). High resolution x-ray diffraction to characterize semiconductor materials. Universidade Estadual de Campinas.

Chicago Style (17th ed.) Citation

Hayashi , Marcelo, Rogério Marcon, Danilo Rocha Nunes, Marcelo Hayashi , Rogério Marcon, and Danilo Rocha Nunes. High Resolution X-ray Diffraction to Characterize Semiconductor Materials. Universidade Estadual de Campinas, 2020.

MLA (9th ed.) Citation

Hayashi , Marcelo, et al. High Resolution X-ray Diffraction to Characterize Semiconductor Materials. Universidade Estadual de Campinas, 2020.